短波红外探测范围型号
IR Beam Profiler for SWIR wavelength range of 900 - 1700 nm
Beam profiles in the SWIR wavelength range (Short Wave Infrared) with high sensitivity at low noise are available with our InGaAs-based BeamPro SWIR beam profilers. These beam profilers are frequently used for tunable laser applications, Raman, 3-Photon microscopy, as well as for 1550 nm, the most widely used wavelength in optical telecom communication. They have an integrated thermo-electric cooling (TEC) to improve sensitivity in low power applications.
900 – 1700 nm
C-mount lens connection
基于InGaAs的光束剖析仪,可适用于可调激光器光束测量、拉曼光谱、三光子显微镜、电信等领域的应用
Integrated thermo-electric cooling for high sensitivity
InGaAs光束分析仪
The optimum wavelength sensitivity in the IR range from 900 – 1700 nm is provided with Femto Easy’s BeamPro SWIR.
HDR Option
With HDR option the beam profiler offers a dynamic range of up to 120 dB (see specs for details).
产品参数
Femto Easy’s BeamPro SWIR beam profilers come with a user-friendly and powerful software at no additional costs. Discover the technical specifications and do not hesitate to contact us for your questions.
SWIR 5.4 | SWIR 10.8 | SWIR 13.10 | SWIR 21.17 | |
---|---|---|---|---|
Spectral range | 900 - 1700 nm | |||
Application | All laser types: CW, pulsed, ultrafast, single-shot | |||
传感器尺寸 (mm) | 4.8 x 3.8 | 9.6 x 7.7 | 12.8 x 10.2 | 21 x 17 |
Sensor type, format | InGaAs, 1/2" | InGaAs, 1" | InGaAs, 1" | InGaAs, APS-C |
分辨率 | 320 x 256 0.08 Mpx | 640 x 512 0.3 Mpx | 1280 x 1024 1.3 Mpx | 640 x 512 0.3 Mpx |
Pixel pitch (μm) | 15 | 15 | 10 | 33 |
最小光束直径 (Φ FWHM, μm) | 75 | 75 | 50 | 270 |
最高采集帧率 (fps)1 | 1000 | 230 | 60 | 230 |
曝光时间 | 10 µs - 50 ms | |||
快门类型 | 全局 | |||
动态范围 | 63 / 120 (with HDR option) | 63 / 120 (with HDR option) | 61 / 120 (with HDR option) | 63 / 120 (with HDR option) |
位深 | 14 | |||
PC接口 | USB 3.0 | |||
同步 | yes with trigger option | |||
尺寸 (mm) | 46 x 46 x 53 | 46 x 46 x 57 | 58 x 58 x 70 | 46 x 46 x 57 |
可选功能
无窗设计: 移除BeamPro传感器窗口,避免潜在干涉条纹
附加滤镜:默认的光束仪包括一个滤光片(ND4)。亦可订购不同规格额外滤光片
高动态范围 :通过软件方式实现,将信号采集的动态范围从12位增加到16位。不兼容纯单脉冲测量,因该功能的实现需连续的两张图像
外部触发器: 将仪器快门动作同步到外部信号,以准确进行单脉冲测量
Beam profiler software STAR
- 即便在分辨率大于两千万像素时,仍可实时读取光束数据
- 支持多种参数及方法(包括ISO计算标准)
- 背景噪声及像热点优化处理,获得最佳的动态和信噪比
- 带有客户端/服务器接口,可通过网络远程控制
- 测量结果记录并可永久访问10个保存的测量数据
- 可同时比较多达10个不同的测量结果
- 一键安装,可自定义配置,带数据导出向导