BeamPro One-Inch Beam Profiler
Beam profiling for large beams up to 25 mm in diameter
Femto Easy BeamPro Once-inch provides ISO-compliant analysis and statistics on the spatial intensity distribution of large area laser beams. The BeamPro software STAR uses standard communication protocols and is therefore easily integrable in any environment. Several BeamPro can be controlled from a remote screen through the network. They are suitable for wavelengths from 375 to 1100 nm and beams as large as 25 mm in diameter.
375 – 1100 nm
大光束孔径25 mm
Perfectly suited for highly divergent beams, VCSEL or laser diodes
One-Inch Beam Profiler
Equipped with a one-inch sensor, this beam profiler is the right partner for large beam diameters.
User-friendly software & electronics design
BeamPro can be controlled from a remote screen through network connection.
产品参数
Femto Easy’s BeamPro One-Inch profiler comes with a user-friendly and powerful software at no additional costs. Compare the technical specifications and discover your favorite model.
beamPro 型号 | BPΦ25 | BP25.16 | ||
---|---|---|---|---|
光谱范围(nm) | 376 - 1100 | 375 - 1100 | ||
传感器尺寸 (mm) | Φ 25 | 25 x 16.1 | ||
传感器格式 | Φ | 4/3" | ||
分辨率 | 4.2 Mpx 2048 x 2048 | 2.3 Mpx 1920 x 1200 | ||
像素 (µm) | 12.65 | 13.48 | ||
快门类型 | 全局 | 全局 | ||
最小光束直径 (Φ FWHM, µm) | 63 | 68 | ||
最高采集帧率 (fps)1 | 80 | 47 | ||
曝光时间 | 40 µs - 1 s | 20 µs - 1 s | ||
动态范围 | 58 | 70 | ||
价格 | ■ ■ ■ ■ | ■ ■ ■ ■ | ||
传感器类型 | CMOS | |||
位深 | 12 / 16 (HDR Option) | |||
PC接口 | USB 3.1 | |||
同步 | Yes with trigger option | |||
尺寸 (mm) | 37 x 40 x 55 |
可选功能
附加滤镜:: The default BeamPro configuration includes one ND4 filter. Additional filter with different specifications can be ordered
High dynamic range (16 dB): Software mode to increase the dynamic range of the BeamPro signal acquisition from 12 to 16 bits. Not compatible with pure single-shot measurements as 2 images are necessary to build one beam profile image
外部触发器: Synchronization of the BeamPro detection to an external signal for accurate laser single-pulse measurement
Beam profiler software STAR
- 即便在分辨率大于两千万像素时,仍可实时读取光束数据
- 支持多种参数及方法(包括ISO计算标准)
- 背景噪声及像热点优化处理,获得最佳的动态和信噪比
- 带有客户端/服务器接口,可通过网络远程控制
- 测量结果记录并可永久访问10个保存的测量数据
- 可同时比较多达10个不同的测量结果
- 一键安装,可自定义配置,带数据导出向导